Whole blade capture
High optical resolution
Automated evaluation
Fast measurement

µsurf blade – Blade edge measurement system

The µsurf blade was developed for the measurement and evaluation of cutting-edge geometries, foils or membranes up to a total thickness of 0.8 mm. The special configuration of two measurement systems achieves nanometer precision resolution.

Both sides of the sample are measured independently and are integrated in a 3D overall image from which the absolute thickness profile is determined. The patented fully-automated calibration of the system produces reliable measurement results.

 Cutting insert

 Tool cutter

 Razor blade

Contact:
NanoFocus, Inc.
Dr. Christian M. Wichern

Innsbrook Corporate Center
4470 Cox Road, Suite 250
Glen Allen, Virginia 2306

Tel: ++1 (804)-228-4195
Fax: ++1 (804)-527-1816
E-mail: solutions@nanofocus-us.com
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NanoFocus, Inc.

Tel.: 1 804-228-4195
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Nanometer Resolution.

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